FIB-based Atom Probe Specimen Preparation of Powders
نویسندگان
چکیده
منابع مشابه
Specimen preparation for correlating transmission electron microscopy and atom probe tomography of mesoscale features.
Atom-probe tomography (APT) provides atomic-scale spatial and compositional resolution that is ideally suited for the analysis of grain boundaries. The small sample volume analyzed in APT presents, however, a challenge for capturing mesoscale features, such as grain boundaries. A new site-specific method utilizing transmission electron microscopy (TEM) for the precise selection and isolation of...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2006
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927606062817